FAI Semi-Automatic First Article Inspection Instrument. Utilizes visual scanning, automatic image comparison of large materials and screen-printed resistors, small material testing, automatic determination of test results, and supports dual-screen display to avoid operators frequently looking up and down. It addresses the challenges faced by SMT production workshops in electronics factories, such as time-consuming sample inspection during the manufacturing process, high labor costs, incomplete inspection coverage, high error rates, and difficulty in traceability.
Advantages
Minimal Programming: Simply import the BOM and coordinates, and the system will automatically parse the BOM specifications and parameters, generating a test program in just 3 minutes.
Automatic Recognition and Judgment of Silk Screening, Direction, and Polarity:For components such as IC chips, diodes, transistors, and resistors and capacitors with characters, the system can use vision comparison technology similar to AOI for automatic comparison.
Automatic determination of test results:The system receives high-resolution images from the scanner and test data from the digital bridge. The testing process is fully automated, requiring no manual range switching or comparison of measurement values, and automatically determines the test results.
Can illuminate LEDs and measure diode polarity
Automatic generation of test reports:After testing is complete, the system automatically generates a test report. The report contains comprehensive data, with test results clearly presented. It can recreate the testing scenario and has strong traceability. The report can be exported as an Excel or PDF document to meet transmission requirem
